Topic：Economic and Resilience Value of Adding Battery Capacity to Photovoltaic Array Generation
Speaker：Professor David W. Coit, Department of Industrial & Systems Engineering, Rutgers University
Date：July 4, at 15:00-16:00
Venue：Room 320, Weimin Building
Abstract：
Power systems with photovoltaic (PV) arrays combined with battery backup storage are analyzed to assess their capability of working in power island mode during grid outages. The problem is to determine the optimal battery sizes for PV + battery systems with given solar array sizes, from both reliability and economical perspectives. A simulation-based optimization method is developed to investigate the effects of battery and PV array size on meeting load demand of facilities at different reliability levels during grid outages with minimal cost. Realistic power interruption statistics are combined with the economic costs incurred when PV + battery systems might fail to provide adequate backup. Based on actual solar irradiation data and load profiles of facilities, the methodology is tested using three evaluation metrics with case studies. The impact of variability associated with battery price on optimal configuration of PV array + battery system is illustrated with representative examples. Sensitivity analysis is also performed to study how cost affects islanding capability of a PV + battery system to supply reliable energy to facilities. The proposed methodology can be utilized as a decision-making tool for future PV + battery resilient system design.
Biography of the Speaker：
David W. Coit is a professor in the Department of Industrial & Systems Engineering at Rutgers University, Piscataway, NJ, USA. His current teaching and research involves system reliability modeling and optimization, and energy systems optimization. His research has been funded by National Science Foundation (NSF), U.S. Army, U.S. Navy, industry, and power utilities. He has over 90 published journal papers and over 90 peer-reviewed conference papers. He was awarded a CAREER grant from NSF to develop new reliability optimization algorithms considering uncertainty. In 2010, he was awarded a NSF grant to study the integration of quality and reliability models for evolving technologies. He is a recipient of the P. K. McElroy award, Alain O. Plait award and Willian A. J. Golomski award for best papers and tutorials at the Reliability and Maintainability Symposium (RAMS). He received a BS degree in mechanical engineering from Cornell University, an MBA from Rensselaer Polytechnic Institute, and MS and PhD degrees in industrial engineering from the University of Pittsburgh. He also has over ten years of experience working for IIT Research Institute (IITRI), Rome NY, where he was a reliability analyst, project manager, and engineering group manager. He is a Department Editor for IIE Transactions and an Associate Editor for Journal of Risk and Reliability, and he is a member of IIE and INFORMS.
School of Reliability and Systems Engineering
